Impact of Temperature on Test Quality
Year: 2010
Type: conference-paper
Authors: Lavanya Jagan, Camelia Hora, Bram Kruseman, Stefan Eichenberger, Ananta K. Majhi, V. Kamakoti
Institutions: Indian Institute of Technology Madras, NXP (Netherlands)
Language: English
Subfield: Hardware and Architecture
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2053790230