Work

NIM- a noise index model to estimate delay discrepancies between silicon and simulation

Year: 2010

Type: conference-paper

Source: Design, Automation, and Test in Europe

DOI: 10.1109/date.2010.5457025

Authors: Elif Alpaslan, Jennifer Dworak, Bram Kruseman, Ananta K Majhi, Wilmar M Heuvelman, Paul van de Wiel

Institution: Brown University

Language: English

Topic: Low-power high-performance VLSI design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4246085191

FWCI: 1.283

Cites: 20

Cited by: 3

Related to: 10