Work

Material characterization and non-destructive failure analysis by transient pulse generation and IR-thermography

Year: 2008

Type: conference-paper

Source: International Workshop on Thermal Investigations of ICs and Systems

DOI: 10.1109/therminic.2008.4669877

Authors: D. May, B. Wunderle, M. Abo Ras, W. Faust, A. Gollhard, R. Schacht, B. Michel

Institutions: Fraunhofer Institute for Reliability and Microintegration, Angewandte Micro Messtechnik (Germany)

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2113703288

FWCI: 1.401

Cites: 4

Cited by: 10

Related to: 10