Work

Theoretical study of SEUs in 0.25-/spl mu/m fully-depleted CMOS/SOI technology

Year: 1994

Type: article

Source: IEEE Transactions on Nuclear Science

DOI: 10.1109/23.340579

Authors: C. Brisset, P. Dollfus, O. Musseau, J.-L. Leray, P. Hesto

Institutions: Université Paris-Sud, Centre National de la Recherche Scientifique, Commissariat à l'Énergie Atomique et aux Énergies Alternatives, CEA DAM Île-de-France

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2118913894

FWCI: 1.917

Cites: 21

Cited by: 15

Related to: 10