Secondary ion mass spectrometry round-robin study of relative sensitivity factors in gallium arsenide
Year: 1998
Type: article
Source: Surface and Interface Analysis
Authors: Y. Homma, F. Tohjou, A. Masamoto, M. Shibata, H. Shichi, Y. Yoshioka, T. Adachi, T. Akai, Y. Gao, M. Hirano, T. Hirano, A. Ihara, T. Kamejima, H. Koyama, M. Maier, S. Matsumoto, H. Matsunaga, T. Nakamura, T. Obata, K. Okuno, S. Sadayama, K. Sasa, K. Sasakawa, Y. Shimanuki, S. Suzuki, D. E. Sykes, I. Tachikawa, H. Takase, T. Tanigaki, M. Tomita, H. Tosho, S. Kurosawa
Institutions: NTT (Japan), NTT Basic Research Laboratories
Language: English
Subfield: Surfaces, Coatings and Films
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
Funder: Russian Science Foundation
OpenAlex ID: W2122074591