Work

A P-type buried layer for protection against soft errors in high density CMOS static RAMs

Year: 1984

Type: conference-paper

Source: Technical digest - International Electron Devices Meeting/Technical digest

DOI: 10.1109/iedm.1984.190821

Authors: H. Momose, T. Wada, I. Kamohara, M. Isobe, J. Matsunaga, H. Nozawa

Institution: Toshiba (Japan)

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2124367495

FWCI: 3.927

Cites:

Cited by: 10

Related to: 10