Work

The testability features of the MCF5407 containing the 4th generation ColdFire(R) microprocessor core

Year: 2002

Type: conference-paper

Source: IEEE International Test Conference (ITC)

DOI: 10.1109/test.2000.894202

Authors: T.L. McLaurin, F. Frederick

Institution: Motorola (United States)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2124407221

FWCI: 1.806

Cites: 2

Cited by: 34

Related to: 10