Work

Experimental transient analysis of the tunnel current in EEPROM cells

Year: 1990

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/16.52445

Authors: R. Bez, D. Cantarelli, P. Cappelletti

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2127690551

FWCI: 7.954

Cites: 17

Cited by: 48

Related to: 10