Work

Experimental detection limits in scanning auger microscopy at high lateral resolution

Year: 1988

Type: article

Source: Surface and Interface Analysis

DOI: 10.1002/sia.740120110

Authors: J. Chazelas, J. Cazaux, G. Gillmann, J. Lynch, R. Szymanski

Institutions: Technicolor (France), Université de Reims Champagne-Ardenne, IFP Énergies nouvelles

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2128667283

FWCI: 1.346

Cites: 3

Cited by: 9

Related to: 10