Work

Automatic generation of functional test pattern for the SCHOLAR system

Year: 2002

Type: conference-paper

DOI: 10.1109/ciccas.1991.184443

Authors: Mike Wai-Tak Wong, K.G. Nichols

Institutions: Hong Kong Polytechnic University, University of Southampton

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2128673532

FWCI: 0.201

Cites: 13

Cited by: 1

Related to: 10