Work

Variation of digital SET pulse widths and the implications for single event hardening of advanced CMOS processes

Year: 2005

Type: article

Source: IEEE Transactions on Nuclear Science

DOI: 10.1109/tns.2005.860679

Authors: J.M. Benedetto, P.H. Eaton, D.G. Mavis, M. Gadlage, T. Turflinger

Institutions: Alliant Techsystems (United States), Naval Sea Systems Command

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2135410147

FWCI: 7.079

Cites: 22

Cited by: 74

Related to: 10