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David G. Mavis

Soft error rate mitigation techniques for modern microcircuits
2003 · D.G. Mavis, P.H. Eaton · IEEE International Reliability Physics Symposium proceedings · 369
Single event transient pulse widths in digital microcircuits
2004 · M.J. Gadlage, R.D. Schrimpf, et al. · IEEE Transactions on Nuclear Science · 150
Digital Single Event Transient Trends With Technology Node Scaling
2006 · J. M. Benedetto, P. H. Eaton, et al. · IEEE Transactions on Nuclear Science · 145
Heavy ion-induced digital single-event transients in deep submicron Processes
2004 · J. Benedetto, P. Eaton, et al. · IEEE Transactions on Nuclear Science · 136
Single event transient pulsewidth measurements using a variable temporal latch technique
2004 · P. Eaton, J. Benedetto, et al. · IEEE Transactions on Nuclear Science · 129
SEU and SET Modeling and Mitigation in Deep Submicron Technologies
2007 · David G. Mavis, Paul H. Eaton · IEEE International Reliability Physics Symposium proceedings · 115
Variation of digital SET pulse widths and the implications for single event hardening of advanced CMOS processes
2005 · J.M. Benedetto, P.H. Eaton, et al. · IEEE Transactions on Nuclear Science · 74
Multiple Bit Upsets and Error Mitigation in Ultra-Deep Submicron SRAMS
2008 · D. G. Mavis, P. H. Eaton, et al. · IEEE Transactions on Nuclear Science · 61
Colliding-beam source for polarized ions
1982 · W. Haeberli, M.D. Barker, et al. · Nuclear Instruments and Methods in Physics Research · 58
Measurement of the magnetic moment of by use of a polarized proton beam and NMR detection
1976 · T. Minamisono, J.W. Hugg, et al. · Physics Letters B · 43
Measurement of the Quadrupole Moment of Li8 by Use of a Polarized Deuteron Beam and NMR Detection
1975 · T. Minamisono, J. W. Hugg, et al. · Physical Review Letters · 42
Employing radiation hardness by design techniques with commercial integrated circuit processes
2002 · D.G. Mavis, D.R. Alexander · IEEE/AIAA Digital Avionics Systems Conference (DASC) · 38
E1 and E2 strength in Mg24 and Mg26 observed in α -capture reactions
1975 · E. Kuhlmann, E. Ventura, et al. · Physical Review C · 33
Investigation of Current Spike Phenomena during Heavy Ion Irradiation of NAND Flash Memories
2011 · Timothy R. Oldham, Melanie Berg, et al. · IEEE Radiation Effects Data Workshop (REDW) · 26
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Measurement of the magnetic dipole moment of β -emitting Al25 by use of a polarized proton beam and nuclear magnetic resonance detection
1976 · T. Minamisono, J. W. Hugg, et al. · Physical Review C · 21
A chip-level modeling approach for rail span collapse and survivability analyses
1989 · D.G. Mavis, D.R. Alexander, et al. · IEEE Transactions on Nuclear Science · 19
Measurement of the magnetic dipole moment of β -emitting S31 by use of a polarized proton beam and nuclear magnetic resonance detection
1976 · T. Minamisono, J. W. Hugg, et al. · Physical Review C · 13
Implications of Total Dose on Single-Event Transient (SET) Pulse Width Measurement Techniques
2008 · A. Balasubramanian, B. Narasimham, et al. · IEEE Transactions on Nuclear Science · 12
Polarized gas jet targets
1984 · J.S. Dunham, C.S. Galovich, et al. · Nuclear Instruments and Methods in Physics Research · 12
Correlation of Laser Test Results With Heavy Ion Results for NAND Flash Memory
2012 · T. R. Oldham, M. R. Friendlich, et al. · IEEE Transactions on Nuclear Science · 11
Total Dose Effect on the Propagation of Single Event Transients in a CMOS Inverter String
2010 · Stephen Buchner, Michael Sibley, et al. · IEEE Transactions on Nuclear Science · 11
SEE characterization and mitigation in ultra-deep submicron technologies
2009 · David G. Mavis, Paul H. Eaton, et al. · IEEE International Conference on IC Design and Technology (ICICDT) · 11
Measurement of the Quadrupole Moment of 8Li by use of a Polarized Beam and NMR Detection
1976 · J. W. Hugg, T. Minamisono, et al. · Proceedings of the Fourth International Symposium on Polarization Phenomena in Nuclear Reactions · 9
Nuclear moment determination of ?-emitting nuclei by use of nuclear reactions initiated with fast polarized beams
1976 · T. Minamisono, J. W. Hugg, et al. · Hyperfine Interactions · 8
E1 and E2 strength in S32 and S34 observed in α -capture reactions
1979 · E. Kuhlmann, J. R. Calarco, et al. · Physical Review C · 7
Works count: 43
Citation count: 1,576
H-index: 16
I10-index: 22
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