Work

Soft error rate mitigation techniques for modern microcircuits

Year: 2003

Type: conference-paper

Source: IEEE International Reliability Physics Symposium proceedings

DOI: 10.1109/relphy.2002.996639

Authors: D.G. Mavis, P.H. Eaton

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2167002145

FWCI: 29.61

Cites: 17

Cited by: 369

Related to: 10