Work

Modified transmission line pulse system and transistor test structures for the study of ESD

Year: 2002

Type: conference-paper

Source: IEEE International Conference on Microelectronic Test Structures (ICMTS)

DOI: 10.1109/icmts.1995.513959

Author: R.A. Ashton

Institution: AT&T (United States)

Language: English

Topic: Electrostatic Discharge in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2136703128

FWCI: 3.379

Cites: 6

Cited by: 21

Related to: 10