Work

An effective parallel ALPG using instruction unrolling for high speed memory testing

Year: 2008

Type: conference-paper

Source: International SoC Design Conference

DOI: 10.1109/socdc.2008.4815649

Authors: Hyunjun Yoon, Myung-Hoon Yang, Yongjoon Kim, Youngkyu Park, Jaeseok Park, Sungho Kang

Institution: Yonsei University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2139085913

FWCI:

Cites: 9

Cited by: 9

Related to: 10