Work

A sophisticated bit-by-bit verifying scheme for NAND EEPROMs

Year: 2002

Type: conference-paper

Source: Symposium on VLSI Circuits

DOI: 10.1109/vlsic.1998.688098

Authors: K. Sakui, K. Kanda, H. Nakamura, K. Imamiya, J. Miyamoto

Institution: Toshiba (Japan)

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Volvo Research and Educational Foundations

OpenAlex ID: W2139151515

FWCI:

Cites: 4

Cited by: 2

Related to: 10