Work

Characterization and Investigation of a Hot-Carrier Effect in Via-Contact Type a-InGaZnO Thin-Film Transistors

Year: 2013

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/ted.2013.2253611

Authors: Tien-Yu Hsieh, Ting-Chang Chang, Yu-Te Chen, Po-Yung Liao, Te-Chih Chen, Ming-Yen Tsai, Yu-Chun Chen, Bo-Wei Chen, Ann-Kuo Chu, Cheng-Hsu Chou, Wang-Cheng Chung, Jung-Fang Chang

Institutions: National Sun Yat-sen University, InnoLux (Taiwan)

Language: English

Topic: Thin-Film Transistor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2139337273

FWCI: 0.786

Cites: 15

Cited by: 10

Related to: 10