A robust reliability methodology for accurately predicting Bias Temperature Instability induced circuit performance degradation in HKMG CMOS
Year: 2011
Type: conference-paper
Authors: D.P. Ioannou, K. Zhao, A. Bansal, B. Linder, R. Bolam, E. Cartier, J.-J. Kim, R. Rao, G. La Rosa, G. Massey, M. Hauser, K. Das, J.H. Stathis, J. Aitken, D. Badami, S. Mittl
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2139471975