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Non-RF to RF Test Correlation Using Learning Machines: A Case Study

Year: 2007

Type: conference-paper

Source: IEEE VLSI Test Symposium (VTS)

DOI: 10.1109/vts.2007.41

Authors: Haralampos-G.D. Stratigopoulos, Petros Drineas, Mustapha Slamani, Yiorgos Makris

Institutions: Techniques of Informatics and Microelectronics for Integrated Systems Architecture, Rensselaer Polytechnic Institute, IBM (United States), Yale University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2139497890

FWCI: 3.546

Cites: 19

Cited by: 68

Related to: 10