Work

Embedded flash memories-technology assessment and future

Year: 2003

Type: conference-paper

Source: International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)

DOI: 10.1109/vtsa.1999.786030

Author: K. Yoshikawa

Institution: Toshiba (Japan)

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2140256154

FWCI: 1.798

Cites: 2

Cited by: 8

Related to: 10