Work

A Yield and Reliability Improvement Methodology Based on Logic Redundant Repair with a Repairable Scan Flip-Flop Designed by Push Rule

Year: 2012

Type: article

Source: ACM Transactions on Design Automation of Electronic Systems

DOI: 10.1145/2159542.2159549

Authors: Masanori Kurimoto, Jun Matsushima, Shigeki Ohbayashi, Yoshiaki Fukui, Michio Komoda, Nobuhiro Tsuda

Institution: Renesas Electronics (Japan)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2142018126

FWCI:

Cites: 17

Cited by: 5

Related to: 10