Work

Enrichment of limited training sets in machine-learning-based analog/RF test

Year: 2009

Type: conference-paper

Source: Design, Automation, and Test in Europe

DOI: 10.1109/date.2009.5090931

Authors: H.-G. Stratigopoulos, S. Mir, Y. Makris

Institutions: Institut polytechnique de Grenoble, Centre National de la Recherche Scientifique, Université Joseph Fourier, Techniques of Informatics and Microelectronics for Integrated Systems Architecture, Yale University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2144635679

FWCI: 1.44

Cites: 12

Cited by: 38

Related to: 10