Work

Muon-Induced Single Event Upsets in Deep-Submicron Technology

Year: 2010

Type: article

Source: IEEE Transactions on Nuclear Science

DOI: 10.1109/tns.2010.2080689

Authors: Brian D. Sierawski, Marcus H. Mendenhall, Robert A. Reed, Michael A. Clemens, Robert A. Weller, Ronald D. Schrimpf, Ewart W. Blackmore, Michael Trinczek, Bassam Hitti, Jonathan A. Pellish, Robert C. Baumann, Shi-Jie Wen, Rick Wong, Nelson Tam

Institutions: Vanderbilt University, TRIUMF, Goddard Space Flight Center, Texas Instruments (United States), Cisco Systems (United States), Marvell (United States)

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Goddard Space Flight Center

OpenAlex ID: W2148186459

FWCI: 2.941

Cites: 16

Cited by: 123

Related to: 10