Work

Reliability characterization of Phase Change Memory

Year: 2009

Type: conference-paper

Source: Non-Volatile Memory Technology Symposium

DOI: 10.1109/nvmt.2009.5429783

Authors: B. Gleixner, F. Pellizzer, R. Bez

Language: English

Topic: Phase-change materials and chalcogenides

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2149122124

FWCI: 31.75

Cites: 12

Cited by: 72

Related to: 10