Work

Effect of analytical method on thickness measurements of thin oxide films

Year: 1988

Type: article

Source: Surface and Interface Analysis

DOI: 10.1002/sia.740110806

Authors: R. L. Tapping, R. D. Davidson, T. E. Jackman, J. A. Davies

Institutions: National Research Council Canada, McMaster University

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2153169574

FWCI:

Cites: 25

Cited by: 13

Related to: 10