Work

A Novel TPG Method for Reducing BIST Test-Vector Size

Year: 2007

Type: conference-paper

Source: International Symposium on High Density packaging and Microsystem Integration

DOI: 10.1109/hdp.2007.4283639

Authors: Jinyi Zhang, Qingfeng Zhang, Jiao Li

Institution: Shanghai University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2157348262

FWCI:

Cites: 9

Cited by: 4

Related to: 10