Work

Reliability issues related to Fast Charge Loss Mechanism in Embedded Non Volatile Memories

Year: 2006

Type: conference-paper

Source: IEEE International Integrated Reliability Workshop final report

DOI: 10.1109/irws.2006.305213

Authors: Pascal Mora, Sophie Renard, Germain Bossu, Patrice Waltz, George Pananakakis, Gerard Ghibaudo

Institution: STMicroelectronics (France)

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2160484371

FWCI: 1.055

Cites: 10

Cited by: 6

Related to: 10