Work

Spectroscopic investigation of (NH4)2S treated GaSeTe for radiation detector applications

Year: 2009

Type: article

Source: Materials Letters

DOI: 10.1016/j.matlet.2009.11.027

Authors: A.J. Nelson, T.A. Laurence, A.M. Conway, E.M. Behymer, B.W. Sturm, L.F. Voss, R.J. Nikolic, S.A. Payne, A. Mertiri, G. Pabst, K.C. Mandal, A. Burger

Institutions: Lawrence Livermore National Laboratory, EIC Laboratories, Fisk University

Language: English

Topic: Chalcogenide Semiconductor Thin Films

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: green

Funders: U.S. Department of Energy, U.S. Department of Homeland Security, Domestic Nuclear Detection Office, Lawrence Livermore National Laboratory

Awards: G1356433355, G14554683, G2145270357, G3584494601, G895139352, G991281326

OpenAlex ID: W2162098523

FWCI: 1.289

Cites: 12

Cited by: 9

Related to: 10