Work

Accurate Prediction of Thermal Resistance of FET by Detailed Modeling of Heat Generation and Backend Stackup

Year: 2012

Type: conference-paper

Source: IMAPSource Proceedings

DOI: 10.4071/isom-2012-wp31

Authors: Qun Wan, Don Willis, Daniel Jin

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2264313285

FWCI:

Cites: 5

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Related to: 10