Work

Oscillation Test Methodology for Built-In Analog Circuits

Year: 2012

Type: article

Authors: Sankari, P Sathish Kumar

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2276007231

FWCI: 0.787

Cites: 2

Cited by: 3

Related to: 10