Work

Efficient Test Methodologies for High-Speed Serial Links

Year: 2009

Type: book

Source: Lecture notes in electrical engineering

DOI: 10.1007/978-90-481-3443-4

Authors: Dongwoo Hong, Kwang-Ting Cheng

Institutions: Broadcom (United States), University of California, Santa Barbara

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2282035948

FWCI: 0.191

Cites: 4

Cited by: 7

Related to: 10