Work

Imaging SIMS at 20 nm Lateral Resolution: Exploratory Research Applications

Year: 1986

Type: book-chapter

Source: Springer series in chemical physics

DOI: 10.1007/978-3-642-82724-2_31

Authors: R. Levi-Setti, G. Crow, Y. L. Wang

Institution: University of Chicago

Language: English

Topic: Ion-surface interactions and analysis

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2287201006

FWCI: 1.349

Cites: 15

Cited by: 17

Related to: 10