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G. Crow

Observed names: Crow, Geoffrey A., G Crow, G. A. Crow, Geoffrey A. Crow, Geoffrey Crow
OpenAlex ID: A5110076240
High-Resolution Scanning-Ion-Microprobe Study of Graphite and its Intercalation Compounds
1985 · R. Levi-Setti, G. Crow, et al. · Physical Review Letters · 57
Scanning ion microscopy: Elemental maps at high lateral resolution
1986 · R. Levi-Setti, Y.L. Wang, et al. · Applied Surface Science · 55
High Spatial Resolution Sims With the Uc-hrl Scanning Ion Microprobe
1984 · R. Levi-Setti, Y. L. Wang, et al. · Le Journal de Physique Colloques · 42
Progress in high resolution scanning ion microscopy and secondary ion mass spectrometry imaging microanalysis.
1985 · R Levi-Setti, G Crow, et al. · PubMed · 30
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A focused ion beam secondary ion mass spectroscopy system
1995 · G. A. Crow, Locke Christman, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 19
Imaging SIMS at 20 nm Lateral Resolution: Exploratory Research Applications
1986 · R. Levi-Setti, G. Crow, et al. · Springer series in chemical physics · 17
The use of vector scanning for producing arbitrary surface contours with a focused ion beam
1988 · G. Crow, J. Puretz, et al. · Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena · 16
Focused-Ion-Beam Micromachined Diode Laser Mirrors
1989 · R. K. DeFreez, J. Puretz, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 7
Application of microscopic probes to the study of graphite intercalation compounds
1985 · D.M. Hwang, R. Levi-Setti, et al. · Synthetic Metals · 6
Focused ion beam micromachining of Si and GaAs using Ga and Au liquid metal ion sources
1990 · Crow, Geoffrey A. · 4
High lateral resolution SIMS mapping of meteorite chondrule
1985 · Y.L. Wang, G. Crow, et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 4
Effect of weak uniform frustration on the resistive transition in a Josephson junction array
1988 · John P. Carini, Sidney R. Nagel, et al. · Solid State Communications · 3
Analytical Applications Of Focused Ion Beams
1985 · N. W. Parker, W. P. Robinson, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2
Focused-Ion-Beam Micromachining Of Diode Laser Mirrors
1988 · R. A. Elliott, R. K. DeFreez, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1
SIMS input lens
1993 · Robert L. Gerlach, Michael R. Scheinfein, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
Focused Ion Beam Micromachining of Silicon and Gallium Arsenide Using Gallium and Gold Liquid Metal Ion Sources
1990 · G. Crow
Works count: 16
Citation count: 263
H-index: 7
I10-index: 7
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