Work

Microprocessor testability

Year: 1989

Type: article

Source: IEEE Transactions on Industrial Electronics

DOI: 10.1109/41.19064

Authors: H.T. Nagle, R.R. Fritzemeier, J.E. Van Well, M.G. McNamer

Institutions: North Carolina State University, Sandia National Laboratories

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funders: North Carolina State University, Sandia National Laboratories

OpenAlex ID: W2293340971

FWCI:

Cites: 37

Cited by: 5

Related to: 10