Work

Aggressive Test Cost Reductions Through Continuous Test Effectiveness Assessment

Year: 2016

Type: article

Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

DOI: 10.1109/tcad.2016.2535902

Authors: Baris Arslan, Alex Orailoglu

Institutions: Istanbul Şehir University, University of California San Diego

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2312909573

FWCI: 2.021

Cites: 36

Cited by: 10

Related to: 10