Work

Hourglass concept for RRAM: A dynamic and statistical device model

Year: 2014

Type: conference-paper

Source: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

DOI: 10.1109/ipfa.2014.6898205

Authors: R. Degraeve, A. Fantini, N. Raghavan, L. Goux, S. Clima, Y. Y. Chen, A. Belmonte, S. Cosemans, B. Govoreanu, D. J. Wouters, Ph. Roussel, G. S. Kar, G. Groeseneken, M. Jurczak

Institutions: IMEC, Singapore University of Technology and Design, KU Leuven

Language: English

Topic: Advanced Memory and Neural Computing

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2324577940

FWCI: 7.226

Cites: 22

Cited by: 51

Related to: 10