Work

Fault Diagnosis of LSI Based on ANN and GMTC

Year: 2004

Type: article

Source: Journal of Hunan University

Author: Wei Xu

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2385339185

FWCI:

Cites:

Cited by:

Related to: 10