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The Study of Testing Generation Method for Mixed-Signal Circuits

Year: 2012

Type: conference-paper

Source: International Conference on Electric Information and Control Engineering

DOI: 10.1109/iceice.2012.1339

Authors: Qingyao Xu, Shaohui Cui, Dan Fang, Lu-jie Han, Changbin Xu

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2394022884

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