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Reduction of the premetal dielectric thermal budget for a 0.35mm technology
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Year:
1996
Type:
article
Authors:
J. Waeterloos,
H. Meynen,
Muriel de Potter de ten Broeck,
B. Coenegrachts,
Teng Gao,
Joost Grillaert,
Luc Van den hove,
Karen Maex
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Language:
English
Topic:
Copper Interconnects and Reliability
Subfield:
Electronic, Optical and Magnetic Materials
Field:
Materials Science
Domain:
Physical Sciences
Open Access status:
closed
OpenAlex ID:
W2523948962
FWCI:
Cites:
Cited by:
Related to:
10