Work

Study and modeling of defects in integrated circuits for their reliability analysis

Year: 2012

Type: conference-paper

DOI: 10.1109/icm.2012.6471398

Authors: G. Ait Abdelmalek, R. Ziani, M. Laghrouche

Institution: Mouloud Mammeri University of Tizi-Ouzou

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2543781447

FWCI:

Cites: 3

Cited by:

Related to: 10