Work

Waveform measurements in high speed silicon bipolar circuits using a picosecond photoelectron scanning electron microscope

Year: 1987

Type: conference-paper

Source: Technical digest - International Electron Devices Meeting/Technical digest

DOI: 10.1109/iedm.1987.191357

Authors: P. May, J.-M. Halbout, C.T. Chuang, G.P. Li

Institution: IBM Research - Thomas J. Watson Research Center

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2575235354

FWCI: 2.415

Cites: 1

Cited by: 2

Related to: 10