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G.P. Li
Observed name:
G.-P. Li
Institution:
IBM Research - Thomas J. Watson Research Center
Observed institutions:
IBM (United States),
IBM Research - Thomas J. Watson Research Center
OpenAlex ID:
A5050002872
A submicrometer high-performance bipolar technology
1989
·
T.-C. Chen
, K.Y. Toh
, et al.
·
IEEE Electron Device Letters
·
41
An advanced high-performance trench-isolated self-aligned bipolar technology
1987
·
G.P. Li
, T.H. Ning
, et al.
·
IEEE Transactions on Electron Devices
·
41
Bipolar transistor with self-aligned lateral profile
1987
·
G.P. Li
, Tze-Chiang Chen
, et al.
·
IEEE Electron Device Letters
·
20
A 23 ps/2.1 mW ECL gate
2003
·
K.-Y. Toh
, C.-T. Chuang
, et al.
·
Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference
·
18
Lateral encroachment of extrinsic-base dopant in submicrometer bipolar transistors
1987
·
Pong-Fei Lu
, G.P. Li
, et al.
·
IEEE Electron Device Letters
·
11
A sub-50 ps single poly planar bipolar technology
2003
·
T.C. Chen
, D.D. Tang
, et al.
·
Technical digest - International Electron Devices Meeting/Technical digest
·
7
On the narrow-emitter effect of advanced shallow profile bipolar transistors
1987
·
G.P. Li
, C.T. Chuang
, et al.
·
Technical digest - International Electron Devices Meeting/Technical digest
·
5
Effects of processing conditions on the characteristics of platinum silicide Schottky barrier diodes
1988
·
D. Moy
, S. Basavaiah
, et al.
·
Solid-State Electronics
·
3
Waveform measurements in high speed silicon bipolar circuits using a picosecond photoelectron scanning electron microscope
1987
·
P. May
, J.-M. Halbout
, et al.
·
Technical digest - International Electron Devices Meeting/Technical digest
·
2
Picosecond Electrical Pulses for VLSI Electronics Characterization
1987
·
J-M. Halbout
, P.G. May
, et al.
·
Topical Meeting on Picosecond Electronics and Optoelectronics
Picosecond Electrical Pulses in Microelectronics
1986
·
P.G. May
, G.P. Li
, et al.
·
International Conference on Ultrafast Phenomena
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Works count:
11
Citation count:
148
H-index:
6
I10-index:
5
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