Work

Qualification of tied-off signals inSoC verification using mutation analysis

Year: 2016

Type: conference-paper

Source: International Conference on Computing, Communication and Automation

DOI: 10.1109/ccaa.2016.7813952

Author: Prokash Ghosh

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2575998282

FWCI:

Cites: 5

Cited by:

Related to: 10