Work

Structural and electrical characterizations of nanometer scaled aluminum oxide in metal / insulator / silicon (100) heterostructures

Year: 2011

Type: article

Source: HAL

Authors: Rochdi, N., Raïssi, Mahfoudh, Vizzini, S., Coudreau, C., Lazzari, J.-L., Aufray, B., Oughaddou, H., Arnaud d'Avitaya, F.

Institution: Centre Interdisciplinaire de Nanoscience de Marseille

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2611565652

FWCI:

Cites:

Cited by: 2

Related to: 10