Work

Adaptive accelerated aging with 28nm HKMG technology

Year: 2017

Type: conference-paper

Source: IEEE International Reliability Physics Symposium proceedings

DOI: 10.1109/irps.2017.7936351

Authors: Devyani Patra, Ahmed Kamal Reza, Mohammed Khaled Hassan, Mehdi Katoozi, Ethan H. Cannon, Kaushik Roy, Yu Cao

Institutions: Arizona State University, Purdue University West Lafayette, Boeing (United States)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funders: U.S. Department of Defense, Defense Advanced Research Projects Agency

OpenAlex ID: W2620936769

FWCI: 0.388

Cites: 4

Cited by: 2

Related to: 10