Work

A Design-for-Test Solution for Monolithic 3D Integrated Circuits

Year: 2017

Type: conference-paper

Source: IEEE International Conference on Computer Design: VLSI in Computers and Processors (ICCD)

DOI: 10.1109/iccd.2017.119

Authors: Abhishek Koneru, Sukeshwar Kannan, Krishnendu Chakrabarty

Institutions: Duke University, GlobalFoundries (United States)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2770372249

FWCI: 1.356

Cites: 12

Cited by: 8

Related to: 10