Work

Improving Diagnosis Resolution and Performance at High Compression Ratios

Year: 2018

Type: conference-paper

Source: IEEE International Test Conference (ITC)

DOI: 10.1109/test.2018.8624829

Authors: Sameer Chillarige, Atul Chhabra, Anil Malik, Bharath Nandakumar, Joe Swenton, Krishna Chakravadhanula

Institutions: Cadence Design Systems (India), Cadence Design Systems (United States)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2913368944

FWCI: 0.548

Cites: 22

Cited by: 5

Related to: 10