Work

An Efficient Use of Memory Grouping Algorithm for Implementation of BIST in Self Test

Year: 2019

Type: article

Source: Journal of Engineering and Applied Sciences

DOI: 10.36478/jeasci.2019.2695.2700

Authors: Sunil Kumar Ojha, O.P. Singh, G.R. Mishra, P.R. Vaya

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: diamond

OpenAlex ID: W2996931041

FWCI: 0.233

Cites:

Cited by: 1

Related to: 10