ANGULAR DEPENDENCE OF THE SECONDARY ELECTRON EMISSION COEFFICIENT OF SINGLE- CRYSTAL SILICON IN THE RANGE OF INCIDENT ELECTRON ENERGY FROM 100 TO 2000 eV.
Year: 1968
Type: article
Authors: A.R. Shul'man, V.V. Korablev, Yu. A. Morozov
Language: English
Subfield: Surfaces, Coatings and Films
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W306988063