Work

Reconfigurable PETPG for External Testing of Digital Circuits

Year: 2020

Type: conference-paper

Source: International Conference on Computer Engineering & Systems (ICCES)

DOI: 10.1109/icces51560.2020.9334582

Authors: Mahmoud Fathy Al-Sawah, Mohamed H. El-Mahlawy, Mohamed A. Abbass

Institutions: Future University in Egypt, Military Technical College

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W3128024298

FWCI:

Cites: 18

Cited by: 1

Related to: 10